Local fourier slice photography
In: ACM transactions on graphics: TOG/ Association for Computing Machinery - New York, NY [u.a.]: ACM, Volume 39 (2020), issue 3, article 24, 16 Seiten

Ray-tracing based image correction of optical distortions for PIV measurements in packed beds
In: Journal of advanced optics and photonics - Henderson, NV: Tech Science Press, Bd. 1.2018, 2, S. 71-94

Bendlets: a second-order shearlet transform with bent elements
In: Applied and computational harmonic analysis - San Diego, Calif. [u.a.]: Academic Pr., Elsevier Science, insges. 16 S., 2017

Controlling and sampling visibility information on the image plane
In: Eurographics Symposium on Rendering - Experimental Ideas & Implementations 2017/ Sander - The Eurographics Association